锡
卤化物
钙钛矿(结构)
材料科学
离子
兴奋剂
离子键合
相(物质)
磁滞
化学物理
无机化学
化学
结晶学
光电子学
凝聚态物理
冶金
物理
有机化学
作者
Kester O. Ighodalo,Wenjing Chen,Liang Zheng,Yongliang Shi,Shenglong Chu,Yihan Zhang,Rahmatullah Khan,Hongmin Zhou,Xu Pan,Jiajiu Ye,Zhengguo Xiao
标识
DOI:10.1002/anie.202213932
摘要
Ion migration is a notorious phenomenon observed in ionic perovskite materials. It causes several severe issues in perovskite optoelectronic devices such as instability, current hysteresis, and phase segregation. Here, we report that, in contrast to lead halide perovskites (LHPs), no ion migration or phase segregation was observed in tin halide perovskites (THPs) under illumination or an electric field. The origin is attributed to a much stronger Sn-halide bond and higher ion migration activation energy (Ea ) in THPs, which remain nearly constant under illumination. We further figured out the threshold Ea for the absence of ion migration to be around 0.65 eV using the CsSny Pb1-y (I0.6 Br0.4 )3 system whose Ea varies with Sn ratios. Our work shows that ion migration does not necessarily exist in all perovskites and suggests metallic doping to be a promising way of stopping ion migration and improving the intrinsic stability of perovskites.
科研通智能强力驱动
Strongly Powered by AbleSci AI