Atomic‐Thin WS2 Kirigami for Bidirectional Polarization Detection

Abstract The assembly and patterning engineering in two‐dimensional (2D) materials hold importance for chip‐level designs incorporating multifunctional detectors. At present, the patterning and stacking methods of 2D materials inevitably introduce impurity instability and functional limitations. Here, the space‐confined chemical vapor deposition method is employed to achieve state‐of‐the‐art kirigami structures of self‐assembled WS 2 , featuring various layer combinations and stacking configurations. With this technique as a foundation, the WS 2 nano‐kirigami is integrated with metasurface design, achieving a photodetector with bidirectional polarization‐sensitive detection capability in the infrared spectrum. Nano‐kirigami can eliminate some of the uncontrollable factors in the processing of 2D material devices, providing a freely designed platform for chip‐level multifunctional detection across multiple modules.