可靠性(半导体)
加速度
电介质
领域(数学)
实验数据
航程(航空)
计算机科学
统计物理学
工程物理
物理
工程类
电气工程
数学
航空航天工程
统计
经典力学
量子力学
功率(物理)
纯数学
标识
DOI:10.1109/ted.2019.2933612
摘要
In part I of this article, the current understanding and experimental observations of the so-called first breakdown (BD) phenomena are reviewed and summarized with a focus on BD statistics and voltage/field acceleration models because of their critical importance to reliability projection. Experimental BD data over a wide range of dielectric materials are reviewed together in a common framework. A thorough examination of various analytic BD models with key features is provided in comparison with experimental observations. In addition, we highlight advanced numerical BD models, which bring out more detailed aspects of the BD process. This state-of-the-art review can provide researchers and engineers with a coherent, global understanding to help continue their research work in this exciting field of dielectric BD.
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