扫描电子显微镜
微观结构
材料科学
电子背散射衍射
衍射仪
扫描共焦电子显微镜
冶金
复合材料
作者
Ting Yu,Fengping Zhong,Fang Zhang,Chenkai Ying,Guihong Geng
出处
期刊:Journal of physics
[IOP Publishing]
日期:2021-08-01
卷期号:2002 (1): 012010-012010
被引量:3
标识
DOI:10.1088/1742-6596/2002/1/012010
摘要
Abstract Scanning electron microscopy (SEM) plays a very important role in the process of microstructure, fracture analysis, qualitative and quantitative analysis of micro-area composition, microstructure analysis and so on. With the rapid development of material science and technology, various industries also put forward higher and higher requirements on the technical level of testing. Based on the development background of Scanning Electron Microscopy (SEM), this paper introduces the application of scanning electron microscope in the observation of metal microstructure. Mainly about the characteristics of scanning electron microscope to continuous zooming, equipped with advantages of backscatter diffractometer, large depth of field, is advantageous to the samples from the macroscopic characteristics by combining with the analysis of microstructure, and quantitative analysis to test samples, also can research the fracture morphology of the sample, the recrystallization organization, grain orientation and texture characteristics, etc.
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