Integrated transcriptomic and metabolomic analysis reveals the potential mechanisms underlying indium-induced inhibition of root elongation in wheat plants

Soil contamination by indium, an emerging contaminant from electronics, has a negative impact on crop growth. Inhibition of root growth serves as a valuable biomarker for predicting indium phytotoxicity. Therefore, elucidating the molecular mechanisms underlying indium-induced root damage is essential for developing strategies to mitigate its harmful effects. Our transcriptomic findings revealed that indium affects the expression of numerous genes related to cell wall composition and metabolism in wheat roots. Morphological and compositional analysis revealed that indium induced a 2.9-fold thickening and a 17.5 % increase in the content of cell walls in wheat roots. Untargeted metabolomics indicated a substantial upregulation of the phenylpropanoid biosynthesis pathway. As the major end product of phenylpropanoid metabolism, lignin significantly accumulated in root cell walls after indium exposure. Together with increased lignin precursors, enhanced activity of lignin biosynthesis-related enzymes was observed. Moreover, analysis of the monomeric content and composition of lignin revealed a significant enrichment of p-hydroxyphenyl (H) and syringyl (S) units in root cell walls under indium stress. The present study contributes to the existing knowledge of indium toxicity. It provides valuable insights for developing sustainable solutions to address the challenges posed by electronic waste and indium contamination on agroecosystems.