Simple thermal vapor deposition process for and characterization of n-type indium oxysulfide thin films

薄膜 X射线光电子能谱 卢瑟福背散射光谱法 硫化物 带隙 硫黄 无定形固体 分析化学(期刊) 材料科学 化学气相沉积 沉积(地质) 化学 化学工程 纳米技术 光电子学 冶金 结晶学 有机化学 古生物学 工程类 生物 沉积物
作者
Ashwin Jayaraman,Sang Bok Kim,Luke M. Davis,Xiabing Lou,Xizhu Zhao,Roy G. Gordon
出处
期刊:Journal of vacuum science & technology [American Institute of Physics]
卷期号:40 (6) 被引量:2
标识
DOI:10.1116/6.0001997
摘要

The search continues for alternative nontoxic n-type electron transport layers in optoelectronic thin-film devices. Indium oxysulfide, In2(O,S)3, represents one promising material for this application, especially when paired with chalcogenide absorber layers. The ternary nature of the composition allows for electrical conductivity and optical bandgap tuning by tailoring the sulfur to oxygen ratio in the oxysulfide alloy. However, thin films of In2(O,S)3 are typically deposited only by chemical bath deposition or plasma-enhanced atomic layer deposition. We report deposition of thin films of In2(O,S)3 in a custom-built thermal reactor using only water vapor and hydrogen sulfide as the coreactants. This advance is enabled by the use of a recently reported, highly reactive indium formamidinate precursor. As shown by x-ray photoelectron spectroscopy, the composition can be tuned from pure In2O3 to pure In2S3 by varying the ratio of cycles employing water or hydrogen sulfide. The oxygen to the sulfur ratio in the film can be controlled by altering the dose sequence, although films typically contain more sulfur than would be expected naively from the percentage of hydrogen sulfide doses in the deposition recipe. Rutherford backscattering spectrometry confirms the composition is sulfur-rich relative to the dosing ratio. Structural characterization indicates films are relatively amorphous in nature. Electrically, these films offer reasonably constant electron mobility at different O:S ratios, with an electron concentration tunable over 4 orders of magnitude. These oxysulfide films possess a higher indirect bandgap than their oxygen-free indium sulfide counterparts, indicating higher transmittance to blue light. These indium oxysulfide films may be suitable candidates for electron transport layers in thin-film solar cells where their wider bandgap might result in higher optical transparency and thus short circuit current density, while the tunability of their conduction band offset with an absorber layer may result in higher open circuit voltage.

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