比较器
温度测量
电压
大气温度范围
能源消耗
CMOS芯片
偏移量(计算机科学)
逐次逼近ADC
校准
动态范围
能量(信号处理)
电子工程
炸薯条
电压基准
材料科学
计算机科学
电气工程
光电子学
物理
工程类
气象学
量子力学
程序设计语言
作者
Jooeun Kim,Jeongmyeong Kim,Changjoo Park,Minkyu Yang,Wanyeong Jung
标识
DOI:10.1109/lssc.2023.3266437
摘要
This letter presents a SAR temperature sensor using a clocked temperature-voltage comparator. The clocked comparator is designed to have a PTAT input offset voltage, which is quantized by SAR. Temperature transduction is spatially and temporally confined in the comparatorfs dynamic comparison. Other circuit operations are robust to the temperature changes so that the sensorfs measurement range can be maximized. Also, the sensor inherits many good aspects of a SAR ADC, such as simple design and operation, no need for complex digital filtering, and low energy consumption. As a result, the test chip fabricated in a 0.18 μm CMOS process shows a wide temperature sensing range of.50 to +130 ∘C, with a low energy consumption of 38.69 pJ/conv. After two-point calibration, the temperature sensor shows a 3-sigma temperature inaccuracy of.2.54/+2.16 ∘C.
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