Acquisition and Processing of Magnetic Data from LN2 Cooled Perovskite Thin Films Using STEM-DPC

Scanning transmission electron microscopy (STEM) is used to study the composition and structure of materials at nanoscale resolution, enabling unparalleled insight into material characteristics.However, the study of functional properties of materials, such as ferromagnetic domains, have historically received less attention.One main way to study these in STEM is via the differential phase contrast (DPC) technique, which measures the deflection by the Lorentz force on the electron beam due to interaction with local sample magnetization [1].This results in a small shift of the electron beam in the back focal plane, typically on the order of a couple of microradians.Due to advances in fast pixelated direct electron detectors in recent years [2], these types of experiments