期刊:Proceedings of the IEEE [Institute of Electrical and Electronics Engineers] 日期:1988-01-01卷期号:76 (11): 1443-1469被引量:277
标识
DOI:10.1109/5.90114
摘要
The basic mechanisms of space radiation effects on microelectronics are reviewed. Topics discussed include the effects of displacement damage and ionizing radiation on devices and circuits, single-event phenomena, dose enhancement, radiation effects on optoelectronic devices and passive components, hardening approaches, and simulation of the space radiation environment. A summary of damage mechanisms that can cause temporary or permanent failure of devices and circuits operating in space is presented.< >