A Comparative Study of Mid-Crestal Incision and Diode Laser Shaped Incision to Assess Papilla Level in Second Stage Dental Implant Surgery

Objectives: To assess papilla level using different techniques in a second stage dental implant surgery. Materials and Methods: Thirty patients who received 45 dental implants were equally divided into 3 groups of 10 each. Group I patients were operated with a scalpel with mid-crestal incision. In group II, dental implants were exposed with a gallium–aluminum–arsenide diode laser. In group III, dental implants were exposed with I shaped incision using a scalpel. Assessment of modified gingival index (mGI), modified plaque index (mPI), and Jemt index were performed at baseline, 3 months, and 6 months. The measurement of FAJI, FAJAdj, ST height, and CP Bone crest was performed. Results: A significant difference in crestal bone level of FAJ- I, FAJ- adj, ST height, and CP Bone crest was recorded at baseline, 3 months, and 6 months among groups I, II, and III ( P < 0.05). At 6 months, both groups II and III exhibited >60% of papilla fill as compared to group I. Conclusion: Diode laser offers maximum papillary fill and resulted in less crestal bone loss as compared to mid-crestal and I shaped incision during a second stage surgery.