层状结构
板层(表面解剖学)
球晶(高分子物理)
微束
结晶学
材料科学
衍射
聚合物
倾斜(摄像机)
Crystal(编程语言)
扭转
光学
液晶
化学物理
复合材料
化学
物理
几何学
数学
光电子学
计算机科学
程序设计语言
作者
Martin Rosenthal,Giuseppe Portale,Manfred Burghammer,G. Bar,Edward T. Samulski,Dimitri A. Ivanov
出处
期刊:Macromolecules
[American Chemical Society]
日期:2012-09-07
卷期号:45 (18): 7454-7460
被引量:79
摘要
The microstructure of banded spherulites of a typical semirigid-chain polymer, poly(trimethylene terephthalate), PTT, has been explored with microbeam X-ray diffraction. It is shown that during microbeam scans along the spherulite radius, different diffraction peaks exhibit oscillations with the same periodicity, which means that the lamellar twist is strictly uniform and regular. The twisted PTT crystals formed from the melt at 170 °C reveal a one-to-one correlation between the handedness and growth axis polarity. Thus, the lamellae are right-handed for the growth along the negative growth direction (−a) while they are left-handed for the positive growth direction (+a). This is in line with predictions of the KP-model, although the original model cannot explain why, for example left-handed crystals have to grow along (−a). The direction of the chain tilt in the lamellar crystal correlates with the lamellar handedness as postulated by the KP-model. However, the measured chain tilt in the crystal (4°) is too faint to be the primary source of the surface stresses required for twisted lamellar growth.
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