X-ray photoelectron spectroscopic studies of CdSe0.65 Te0.35

The XPS chemical shifts of cadmium in one of its mixed chalcogenides, CdSe0.65 Te0.35, have been studied and compared to the shifts in CdSe and CdTe. The Auger parameter for Cd in CdSe0.65 Te0.35, reflecting mainly extraatomic relaxation effects, was found to be useful in characterizing this compound: it has a value intermediate between those in CdSe and in CdTe. A correlation is observed between shifts in the Auger parameter and energy bandgaps for several cadmium compounds. The Se and Te photoelectron chemical shifts reflect an anionic character in both cases, the Se atom having a larger partial ionic charge.