Defect‐Controlled Preparation of UiO‐66 Metal–Organic Framework Thin Films with Molecular Sieving Capability

Abstract Metal–organic framework (MOF) UiO‐66 thin films are solvothermally grown on conducting substrates. The as‐synthesized MOF thin films are subsequently dried by a supercritical process or treated with polydimethylsiloxane (PDMS). The obtained UiO‐66 thin films show excellent molecular sieving capability as confirmed by the electrochemical studies for redox‐active species with different sizes.