Fiber Surface Analysis with XPS,AFM,Tof-SIMS: Principle and Application

The working principles of several advanced surface analysis instrument including X-ray photoelectron spectroscopy(XPS),atomic force microscopy(AFM) and time of flight secondary ion mass spectroscopy(ToF-SIMS) are introduced, their successful application in fiber surface analysis recent years is reviewed. They can be used and complement each other to analyze and solve the problems which appear in pulping and papermaking process.