表征(材料科学)
衍射仪
纹理(宇宙学)
材料科学
测角仪
方向(向量空间)
扫描电子显微镜
光学
计算机科学
人工智能
复合材料
物理
几何学
纳米技术
图像(数学)
数学
作者
Máté Sepsi,Márton Benke,Valéria Mertinger
标识
DOI:10.1107/s1600576723010993
摘要
The most common methods for texture characterization require cutting a coupon to be inserted into an X-ray texture goniometer or an electron microscope and are, therefore, destructive. However, there are many cases where texture characterization needs to be performed in a non-destructive way, where the measurement can be made without damaging the object. Typical examples are archaeological artefacts or very expensive materials. Here we demonstrate the application of an X-ray diffractometer mounted on a robotic arm designed for residual stress scanning for texture characterization, enabling the determination of the orientation distribution function for different locations on samples with complex geometries. The texture characterization method was benchmarked on a cold-rolled aluminium sheet.
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