Determination of Minor Elements in Prebaked Anode by X-ray Fluoresence Spectrometry

A method has been developed for the determination of minor and trace elements,viz.F,Na,Mg,Al,Si,P,S,Cl,K,Ca,Ba,Ti,V,Cr,Mn,Fe,Ni,Cu,Zn,Pb,Sr and Sn in prebaked anode by X-ray fluorescence spectrometer(Magix PW2403) with pressed powder pellet sample preparation technique and C-300 serial standard samples(Switzerland R D carbon company).The interelement and matrix effects were corrected by using empirical alpha(α) coefficient program(Classic)provided by the Super Q software and by using RhK Compton scattered line as internal standard.The precision of the method has been examined by analyzing a prebaked anode standard sample 11 times.The relative standard deviations(RSD)obtained for those elements were less than 10%.The detection limits for most of the elements were less than 1 μg·g-1.The accuracy of the method has been evaluated by analyzing four C-300 standard reference samples(Anode-mix 1 to 4);the discrepancies between the results obtained by the present method and the certified values were within the allowable range of chemical analysis.