投影机
轮廓仪
公制(单位)
结构光三维扫描仪
整改
计算机视觉
光学
计算机科学
投影(关系代数)
人工智能
校准
失真(音乐)
极线几何
数学
物理
扫描仪
算法
图像(数学)
表面粗糙度
工程类
放大器
计算机网络
功率(物理)
运营管理
统计
带宽(计算)
量子力学
作者
Rigoberto Juarez-Salazar,Obed I. Rios-Orellana,Víctor H. Díaz-Ramírez
出处
期刊:Applied Optics
[The Optical Society]
日期:2022-07-11
卷期号:61 (21): 6097-6097
被引量:1
摘要
Fringe projection profilometry requires calibrating both cameras and projectors for metric measurements. Cameras are relatively simple to calibrate, but projectors require more sophisticated procedures. In this paper, a fringe projection profilometer with two calibrated cameras and one uncalibrated projector is developed for metric measurements. A phase rectification method, which is crucial for stereo matching, is designed by minimizing the perspective distortion. Also, a simple method for point matching using stereo rectified phase maps is proposed. The principles of metric profilometry using the proposed rectification method are introduced. The developed system is evaluated experimentally by the metric measurement of three-dimensional objects. The obtained results confirm a high accuracy of metric measurement and versatility in the design of fringe projection profilometers with uncalibrated projectors.
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