石墨烯
异质结
材料科学
带偏移量
凝聚态物理
双极扩散
电介质
石墨烯纳米带
光电子学
电导率
双层石墨烯
电子
纳米技术
带隙
价带
化学
物理
量子力学
物理化学
作者
Kyounghwan Kim,Stefano Larentis,Babak Fallahazad,Kayoung Lee,Jiamin Xue,David C. Dillen,Chris M. Corbet,Emanuel Tutuc
出处
期刊:ACS Nano
[American Chemical Society]
日期:2015-03-13
卷期号:9 (4): 4527-4532
被引量:173
标识
DOI:10.1021/acsnano.5b01114
摘要
Using different types of WSe2 and graphene-based heterostructures, we experimentally determine the offset between the graphene neutrality point and the WSe2 conduction and valence band edges, as well as the WSe2 dielectric constant along the c-axis. In a first heterostructure, consisting of WSe2-on-graphene, we use the WSe2 layer as the top dielectric in dual-gated graphene field-effect transistors to determine the WSe2 capacitance as a function of thickness, and the WSe2 dielectric constant along the c-axis. In a second heterostructure consisting of graphene-on-WSe2, the lateral electron transport shows ambipolar behavior characteristic of graphene combined with a conductivity saturation at sufficiently high positive (negative) gate bias, associated with carrier population of the conduction (valence) band in WSe2. By combining the experimental results from both heterostructures, we determine the band offset between the graphene charge neutrality point, and the WSe2 conduction and valence band edges.
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