开尔文探针力显微镜
聚苯胺
材料科学
纳米颗粒
工作职能
兴奋剂
原子力显微镜
显微镜
伏打电位
静电力显微镜
纳米技术
导电原子力显微镜
Zeta电位
扫描探针显微镜
化学工程
分析化学(期刊)
聚合物
复合材料
光电子学
化学
光学
物理
色谱法
工程类
聚合
图层(电子)
作者
Jinsung Park,Doyeon Bang,Kuewhan Jang,Seungjoo Haam,Jaemoon Yang,Sungsoo Na
出处
期刊:Nanotechnology
[IOP Publishing]
日期:2012-08-21
卷期号:23 (36): 365705-365705
被引量:29
标识
DOI:10.1088/0957-4484/23/36/365705
摘要
The work function of polyaniline nanoparticles in the emeraldine base state was determined by Kelvin probe force microscopy to be ∼270 meV higher than that of similar nanoparticles in the emeraldine salt state. Normal tapping mode atomic force microscopy could not be used to distinguish between the particles due to their similar morphologies and sizes. Moreover, other potential measurement systems, such as using zeta potentials, were not suitable for the measurement of surface charges of doped nanoparticles due to their encapsulation by interfering chemical groups. Kelvin probe force microscopy can be used to overcome these limitations and unambiguously distinguish between the bare and doped polyaniline nanoparticles.
科研通智能强力驱动
Strongly Powered by AbleSci AI