尖晶石
相(物质)
透射电子显微镜
结晶学
基质(水族馆)
材料科学
化学气相沉积
分析化学(期刊)
扫描电子显微镜
热稳定性
电子衍射
衍射
化学
纳米技术
冶金
光学
物理
地质学
海洋学
复合材料
有机化学
色谱法
作者
Jingyu Tang,Kunyao Jiang,Stephen D. House,Chengchao Xu,Kelly Xiao,Lisa M. Porter,R. F. Davis
摘要
Ga2O3 films were deposited on (100) MgAl2O4 spinel substrates at 550, 650, 750, and 850 °C using metal-organic chemical vapor deposition and investigated using x-ray diffraction and transmission electron microscopy. A phase-pure γ-Ga2O3-based material having an inverse spinel structure was formed at 850 °C; a mixture of the γ-phase and β-Ga2O3 was detected in films grown at 750 °C. Only β-Ga2O3 was determined in the films deposited at 650 and 550 °C. A β- to γ-phase transition occurred from the substrate/film interface during growth at 750 °C. The growth and stabilization of the γ-phase at the outset of film growth at 850 °C was affected by the substantial Mg and Al chemical interdiffusion from the MgAl2O4 substrate observed in the energy-dispersive x-ray spectrum. Atomic-scale investigations via scanning transmission electron microscopy of the films grown at 750 and 850 °C revealed a strong tetrahedral site preference for Ga and an octahedral site preference for Mg and Al. It is postulated that the occupation of these atoms in these particular sites drives the β-Ga2O3 to γ-phase transition and markedly enhances the thermal stability of the latter phase at elevated temperatures.
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