制作
纳米压印光刻
材料科学
光学
平版印刷术
光电子学
可扩展性
相(物质)
沉积(地质)
纳米光刻
原子层沉积
焦距
基点
光刻
波长
光强度
图层(电子)
强度(物理)
领域(数学)
空间频率
纳米技术
薄膜
折射率
焦点
平方(代数)
可见光谱
雷
计算机科学
软光刻
作者
Xu Mao,Gang Yu,Jiaqi Guo,Hongsheng Ding,Yongmei Zhao,Chaowei Si,Chao Shen,Fuhua Yang,Xiaodong Wang
标识
DOI:10.1002/lpor.202502378
摘要
ABSTRACT Metalenses with uniform focal arrays (MUFAs), capable of directing incident beams to identical focal points on the same plane, have attracted significant attention due to their roles in advanced applications, including microscopy, light field detection, and optical trapping. However, limitations in existing design and fabrication techniques have hindered the practical applications of MUFAs. In this work, we propose an effective inverse‐design optimization strategy for phase retrieval of MUFAs, enabling high intensity uniformity and flexible geometries. Additionally, we experimentally demonstrate the scalable manufacturing of polarization‐insensitive high‐quality MUFAs in the visible using nanoimprint lithography (NIL). This single‐step NIL fabrication achieves high‐aspect‐ratio nanopillars, facilitating the subsequent deposition of a thin high‐index film via atomic layer deposition to provide full phase coverage. As a proof of concept, metalenses operating at the 450 nm wavelength are explored by producing diverse focal arrays on 4‐inch silica wafers, including intact and defective rings, as well as complex geometries such as square and rhombic lattices. The MUFAs exhibit an average positional inaccuracy of 0.64 µm and a peak intensity uniformity of over 97%, whereas the wafer‐scale spatial uniformity reaches up to approximately 98%. This work may contribute to applications in materials science, biological imaging, and quantum optics.
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