抵抗
极紫外光刻
极端紫外线
平版印刷术
纳米技术
紫外线
化学
材料科学
光学
物理
光电子学
激光器
图层(电子)
作者
Jie Cen,Zhengyu Deng,Shiyong Liu
出处
期刊:Polymer Chemistry
[Royal Society of Chemistry]
日期:2024-01-01
卷期号:15 (45): 4599-4614
被引量:26
摘要
Patterning materials have advanced significantly to achieve high-resolution fabrication of integrated circuits for extreme ultraviolet (EUV) lithography. Emerging trends in the chemistry of polymeric resists for EUV lithography are summarized.
科研通智能强力驱动
Strongly Powered by AbleSci AI