飞秒
材料科学
依赖关系(UML)
折射率
激光器
索引(排版)
光学
光电子学
计算机科学
物理
软件工程
万维网
标识
DOI:10.2961/jlmn.2012.02.0008
摘要
This report describes the filamentary refractive index change under slow-focusing conditions in polydimethylsiloxane using femtosecond pulses from a 1-kHz Ti:sapphire amplifier.The respective influences of laser writing parameters and focusing conditions were studied.The refractive index change was induced by scanning the sample up to 4 mm/s.The refractive index change with a magnitude of 2.3×10 -4 was estimated from the diffraction efficiencies of a volume grating with 300 µm thickness.
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