Research on Lifetime Models of Semiconductor Devices Based on Failure Mechanism

The progress of microelectronics makes the reliability of ICs more and more important.To obtain reliability data in a short period,it is useful to use accelerated life testing(ALT).Using ALT to analyze reliability,an appropriate life model is the key.Different failure mechanisms have different impacts on the lifetimes of devices.In the paper,three main failure mechanisms and their life models are discussed in detail,including electromigration,corrosion and hot carrier injection.The acceleration factors are calculated based on practical data.The lifetimes of microelectronic devices under different situations are compared.