透射率
吸收(声学)
材料科学
紫外线
反射(计算机编程)
反射率
光电子学
吸收光谱法
分析化学(期刊)
光学
化学
复合材料
物理
计算机科学
程序设计语言
色谱法
作者
Rafael Dalmau,J. Britt,R. Schlesser
出处
期刊:ECS transactions
[Institute of Physics]
日期:2020-09-08
卷期号:98 (6): 3-11
被引量:3
标识
DOI:10.1149/09806.0003ecst
摘要
The structural and optical properties of 2-inch AlN substrates grown by physical vapor transport were assessed. Ultraviolet transmittance and absolute reflectance spectra were measured spectrophotometrically. Accurate absorption coefficients were calculated with a method accounting for reflection losses. Production of high-quality, macrodefect-free AlN substrates possessing absorption coefficients at 265 nm with values from 30 to 50 cm -1 was demonstrated.
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