聚芴
材料科学
芴酮
降级(电信)
光化学
纳米技术
光电子学
芴
聚合物
共轭体系
复合材料
计算机科学
电信
化学
作者
Emil List,R. Guentner,Patricia Scanducci de Freitas,Ullrich Scherf
标识
DOI:10.1002/1521-4095(20020304)14:5<374::aid-adma374>3.0.co;2-u
摘要
Keto defect sites play a key role as the source of low-energy emission bands in polyfluorene type materials. The formation of fluorenone defect sites can be regarded as a dominant degradation mechanism in light-emitting devices based on polyfluorenes. The superiority of difunctionalization (see Figure) at the methylene group in –CR2– bridged polyphenylene and polyarylene derivatives is illustrated.
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