材料科学
费米能级
电子结构
肖特基二极管
光电子学
半导体
带隙
量子隧道
退火(玻璃)
凝聚态物理
肖特基势垒
晶体缺陷
欧姆接触
异质结
扫描隧道显微镜
电子能带结构
二极管
密度泛函理论
晶体管
直接和间接带隙
宽禁带半导体
磷化物
热电效应
纳米技术
肖特基缺陷
锑
半导体器件
热传导
混合功能
本征半导体
深能级瞬态光谱
态密度
化学物理
扩展Hückel方法
作者
Zehao Yu,Pin Lyu,Meilin Li,Yanpeng Liu,Lifa Zhang,Xiuling Li,Yunshan Zhao
摘要
Palladium phosphide sulfide (PdPS), a two-dimensional (2D) semiconductor with a unique Cairo pentagonal lattice, shows great potential for optoelectronic and thermoelectric applications. However, its electronic transport behavior is strongly influenced by intrinsic defects. In this work, we systematically investigate the formation mechanisms and electronic consequences of intrinsic point defects in few-layer PdPS using first-principles calculations. We evaluate the formation energies of sulfur (S), phosphorus (P), and palladium (Pd) vacancies, as well as the interstitial Pd atoms and reveal their impacts on the electronic band structure. Unlike common 2D semiconductors like MoS2, PdPS hosts more low-energy defect configurations, which lead to bandgap narrowing, in-gap states as well as a Fermi level shift toward the conduction band. To validate the theoretical predictions, scanning tunneling microscopy measurements were performed, revealing the distinct defect morphologies and confirming the emergence of in-gap states under controlled annealing conditions. Complementary electrical transport measurements reveal a significantly reduced Schottky barrier height and significantly improved electron transport properties, attributed to the defect-induced electronic structure modulation. These results provide atomic-scale insights into the defect-driven phenomena in 2D PdPS, offering a pathway for tailoring electronic properties via defect engineering for future field-effect transistor applications.
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