光电子学
二极管
可靠性(半导体)
材料科学
晶体管
电压
频道(广播)
逻辑门
电气工程
热传导
块(置换群论)
击穿电压
电极
阈值电压
电子工程
电流(流体)
PIN二极管
电流源
反激二极管
减刑
作者
G. Baratella,Urmimala Chatterjee,S. Kumar,Matteo Borga,Karen Geens,Anurag Vohra,Stefaan Decoutere,Benoit Bakeroot
标识
DOI:10.1109/ted.2025.3619922
摘要
In this article, we present dual-gate bidirectional switches (BDSs) rated for 1200-V operation in both positive and negative biases, fabricated on 200-mm GaN-on-QST1 engineered substrates. The switches are p-GaN gate enhancement-mode (E-mode) high-electron-mobility transistors (HEMTs) that can conduct the current and block the voltage in both directions (drain to source or source to drain). The switches are fabricated with different design variations in the channel length and field-plates (FPs) configuration and are tested in all four conduction modes (on-state, forward and reverse diode modes, and off-state). In addition, a hard breakdown of the device well above the rated voltage is demonstrated, along with initial reliability tests that demonstrate promising performance of the devices.
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