Scanning Nearfield Optical Microscopy Studies of Organic Materials
作者
B. Müller-Zülow,Stefan Kämmer,Joachim Weiss,Stefan Gehring
出处
期刊:日期:1996-01-01卷期号:99: CWF54-CWF54
标识
DOI:10.1364/cleo_europe.1996.cwf54
摘要
Scanning Nearfield Optical Microscopy is a relatively young method for viewing materials with a resolution not previously attainable with optical techniques. This microscopy overcomes the conventional Abbe barrier, or diffraction limit, of resolution and allows to enter new optical-characterization fields with submicron resolution. Studies of organic materials using this technique can be found in various fields starting with brightfield imaging of polymer surfaces as well as using fluorescence and polarization contrast. Specific setups of the instrument concerning the sensitivity of detection are even able to study single molecules.