钝化
材料科学
退火(玻璃)
光电子学
硅
平面的
各向同性腐蚀
太阳能电池
共发射极
载流子寿命
吸收(声学)
蚀刻(微加工)
氧化物
热的
光学
复合材料
图层(电子)
计算机图形学(图像)
物理
气象学
冶金
计算机科学
作者
Christoph Schwab,A. Wolf,M. B. Graf,Nico Wöhrle,S. Kühnhold,Johannes Greulich,G. Kästner,D. Bíro,R. Preu
标识
DOI:10.1109/jphotov.2012.2230686
摘要
Silicon solar cells typically feature textured surfaces on the front side to increase light absorption. An unwanted side effect of the texture is an increase in surface recombination compared with smoother surfaces. On the rear side of the solar cell, light absorption is not an issue; therefore, planar surfaces are used to decrease surface recombination. In processing, a planar surface can be achieved by wet chemical single-side etching of previously textured surfaces, resulting in a smoothed rear surface. This study investigates surface passivation of these chemically polished surfaces in dependence on the degree of smoothness. Surface passivation is achieved by thin thermally grown silicon oxides. Special focus is set on injection dependence and the influence of postmetallization annealing. Measured optical properties of different surfaces are compared with different optical simulation models. Finally, recombination and optical properties are connected to solar cell performance of fabricated passivated emitter and rear cells.
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