光电探测器
锗
响应度
材料科学
光电子学
光学
CMOS芯片
电容
硅
物理
电极
量子力学
作者
Guoliang Li,Ying Luo,Xuezhe Zheng,G. Masini,Attila Mekis,Subal Sahni,Hiren D. Thacker,Jin Yao,Ivan N. Shubin,Kannan Raj,J. E. Cunningham,Ashok V. Krishnamoorthy
出处
期刊:Optics Express
[Optica Publishing Group]
日期:2012-11-07
卷期号:20 (24): 26345-26345
被引量:78
摘要
We report design improvements for evanescently coupled Germanium photodetectors grown at low temperature. The resulting photodetectors with 10 μm Ge length manufactured in a commercial CMOS process achieve >0.8 A/W responsivity over the entire C-band, with a device capacitance of <7 fF based on measured data.
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