光电探测器
材料科学
光电子学
光纤
纤维
芯(光纤)
可积系统
光子学
光学
物理
数学物理
复合材料
作者
Zehua Jin,Fan Ye,Xiang Zhang,Suotang Jia,Liangliang Dong,Sidong Lei,Róbert Vajtai,Jacob T. Robinson,Jun Lou,Pulickel M. Ajayan
出处
期刊:ACS Nano
[American Chemical Society]
日期:2018-11-27
卷期号:12 (12): 12571-12577
被引量:19
标识
DOI:10.1021/acsnano.8b07159
摘要
Two-dimensional (2D) van der Waals layered materials possess innate advantages as integrable sensors, due to their thinness, flexibility, and sensitivity. They can be seamlessly integrated onto surfaces with different geometries where detection for near-field signal is desired. In this study, we develop a device transfer technique to integrate device assemblies based on 2D materials onto an arbitrary smooth surface. Such technique utilizes a sacrificial polymer underlayer and achieves clean and nondestructive full device transfer. For demonstration, we transferred a complete 2D multilayer InSe photodetector device onto a stripped optical fiber. Due to the extreme vicinity of the 2D photodetector with the fiber core, the device can effectively couple with the evanescent field and accurately detect information transmitted inside the optical fiber. In addition, these super thin flexible device assemblies can be integrated onto the fibers themselves to non-invasively monitor the optical fiber performance. The demonstration of optically coupled, conformal 2D devices on substrates of different form factors can enable a variety of near-field optical and sensing applications.
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