高电子迁移率晶体管
击穿电压
材料科学
制作
光电子学
泄漏(经济)
电压
电气工程
晶体管
工程类
医学
宏观经济学
病理
经济
替代医学
作者
Mr Amit,D. S. Rawal,Sunil Sharma,Sonalee Kapoor,Robert Liashram,Rupesh K. Chaubey,Seema Vinayak,R. K. Sharma
出处
期刊:Defence Science Journal
[Defence Scientific Information and Documentation Centre]
日期:2018-04-16
卷期号:68 (3): 290-290
被引量:27
标识
DOI:10.14429/dsj.68.12134
摘要
The design and fabrication of gate/source connected multi-finger field plate structures using TCAD ATLAS simulation software is presented. The designed field plate structures are fabricated on indigenous AlGaN/GaN HEMT devices. AlGaN/GaN HEMT devices with field plate structures exhibit about three times improvement in breakdown voltage of device and are in close agreement with the simulation results. Integration of field plates in device have resulted in higher VDS (drain to source voltage) operation and improvement in output power of AlGaN/GaN HEMT devices. Incorporation of field plates also decrease the reverse leakage current of HEMT devices.
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