单层
数码产品
材料科学
光电子学
传输(计算)
纳米技术
柔性电子器件
工程物理
电气工程
工程类
计算机科学
并行计算
作者
Sameer Kumar Mallik,Roshan Padhan,Suman Roy,Mousam Charan Sahu,Sandhyarani Sahoo,Satyaprakash Sahoo
标识
DOI:10.1021/acsanm.3c05400
摘要
Transfer techniques of two-dimensional (2D) materials and devices offer nanoscale integration with the existing silicon-based technology and flexible electronics. To date, the chemical etching technique is being widely used for the transfer of 2D materials, and there has been constant effort in improving the method to achieve an etching-free and clean transfer of 2D materials without affecting the device performances. Herein, we demonstrate a poly(methyl methacrylate) (PMMA)-assisted etching-free one-step approach to transfer device arrays consisting of monolayer MoS 2 and metal electrodes to different substrates (i.e., SiO 2 /Si, flexible). The crystalline quality, strain relaxation, and interfacial coupling effects of the transferred devices are analyzed using Raman and photoluminescence spectroscopy. The room-temperature gate-tunable drain current measurements of the transferred devices on the SiO 2 /Si substrate show a reduced Fermi-level pinning effect. Furthermore, the observation from temperature-dependent threshold voltage shifts, mobilities, and hysteresis evolution indicates an improved transistor performance in the transferred device. The proposed one-step transfer method could be useful to transfer a large array of 2D material devices on arbitrary substrates for future flexible optoelectronic applications.
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