高电子迁移率晶体管
材料科学
击穿电压
光电子学
电压
电场
领域(数学)
电气工程
电子工程
晶体管
工程类
物理
数学
量子力学
纯数学
作者
Ningping Shi,Kejia Wang,Bing Zhou,Jiafu Weng,Zhiyuan Cheng
出处
期刊:Micromachines
[Multidisciplinary Digital Publishing Institute]
日期:2022-04-29
卷期号:13 (5): 702-702
被引量:35
摘要
AlGaN/GaN HEMTs with several different designs of field plate structure are studied for device optimization purposes. To increase device breakdown voltage, optimal dimensions of field plates were first investigated using Silvaco TCAD software, and the electrical characteristics of the devices are analyzed. Several devices were designed and fabricated based on the simulation results. It has been confirmed that the gate-source composite field plate (SG-FP) has a higher breakdown voltage than other types of field plate structures, with FOM reaches 504 MW/cm-2, showing that the device with SG-FP structure outperforms the other three structures. The experiment and simulation verify that the gate-source composite field plate optimizes FOM by increasing the breakdown voltage and reducing the intrinsic on-resistance so that the device has better electrical performance and a wider application range.
科研通智能强力驱动
Strongly Powered by AbleSci AI