稳健性(进化)
光子学
电子束光刻
光子晶体
平版印刷术
炸薯条
电介质
拓扑(电路)
非线性系统
光子集成电路
纳米尺度
光电子学
材料科学
物理
计算机科学
纳米技术
抵抗
电信
工程类
电气工程
量子力学
基因
生物化学
化学
图层(电子)
作者
Yafeng Chen,Zhihao Lan,Jie Zhu
标识
DOI:10.1103/physrevapplied.17.054003
摘要
Second-order photonic topological insulators (SPTIs) with topologically protected corner states possess extraordinary abilities of robust light steering in lower dimensions. However, previous SPTIs are difficult for multiband on-chip applications. To overcome this challenge, we design, via the inverse design method, a SPTI supporting four highly localized corner states within four sizeable band gaps that are robust to bulk impurities. Importantly, the designed SPTI is made of fully connected dielectric materials, which can be readily fabricated in nanoscale via electron-beam lithography and integrated into on-chip circuits. Our work offers potential applications in designing multiband on-chip photonic integrated devices with high efficiency, high capacity, and high robustness for both linear and nonlinear optical processing.
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