X射线光电子能谱
俄歇电子能谱
光谱学
能量色散X射线光谱学
分析化学(期刊)
电子光谱学
X射线光谱学
仪器化学
化学
原子光谱法
材料科学
扫描电子显微镜
时间分辨光谱学
物理
核磁共振
复合材料
量子力学
核物理学
色谱法
作者
Joseph Hamuyuni,Michael O. Daramola,Olugbenga Oludayo Oluwasina
标识
DOI:10.1002/9781118468586.epoc4030
摘要
Examples of these analytical techniques for surfaces are Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), secondary ions mass spectroscopy, atomic force microscopy and energy-dispersive spectroscopy (EDX). EDX is one of the techniques applied in electron probe X-ray microanalysis of materials. Wavelength-dispersive X-ray spectroscopy (WDS) is another technique in this category. While EDX and WDS generate a spectrum whose peaks correspond to specific X-ray lines to identify elements, a significant difference exists in the efficiency and application of these two methods. The energy of the X-rays emitted from a specimen can be measured by an energy dispersive spectrometer. Application of EDX as a technique for qualitative and quantitative analysis has been found in the analysis of varieties of materials in organic and inorganic synthesis, metallurgical and material engineering, catalysis engineering, environmental science, archaeological studies, medical research, pharmaceutical, and membrane synthesis.
Keywords:
atomic force microscopy;
auger electron spectroscopy;
electron energy-loss spectroscopy;
energy-dispersive spectroscopy;
engineering;
environmental science;
secondary ions mass spectroscopy;
wavelength-dispersive X-ray spectroscopy;
X-ray photoelectron spectroscopy
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