Genetic Analysis of Agronomic Traits Related to Yield Based on Major Gene Plus Polygene Model in Wheat

In this paper,inheritance of 7 yield-related traits was analyzed by the joint segregation analysis of a mixed genetic model of major gene plus polygene in five generations(P1,P2,F1,F2and F3)derived from cross Xinong 817×Chinese Spring.The results show that the 7 traits not only were controlled by the genes,but also influenced by environment.Spike length,grains per spike were fitted by polygene model.Plant height,spikelets per spike and compactness were fitted by one additive major gene plus additive-dominance polygenes model.Spike and flag leaf distance was fitted by one completely dominant major gene plus additive-dominance polygene model.Effective tillers were fitted by one negative complete dominant major gene plus additive-dominance polygene model.Genetic analysis of yield-related traits with major gene plus polygene mixed inheritance model in wheat will help to elucidate the genetic mechanism of them.