材料科学
串联
钙钛矿(结构)
氧化镍
镍
硅
氧化物
等离子体
光电子学
化学工程
纳米技术
冶金
复合材料
量子力学
物理
工程类
作者
Xiang Chen,Kun Gao,Xiaohua Xu,Yang Liu,Shibo Wang,Wei Shi,Fengxian Cao,Wenhao Li,Haicheng Li,Yao Li,Bowen Yang,Chang Wang,Wenhao Li,Wenjing Wang,Jihong Xiao,Su Zhou,Shaofei Yang,Cao Yu,Xiaohong Zhang,Xinbo Yang
标识
DOI:10.1002/adma.202504581
摘要
Abstract Nickel oxide (NiO x ) hole transport layer deposited by magnetron sputtering shows high stability, low cost, high reproducibility, and scalability for perovskite and tandem solar cells. However, the performance of perovskite and tandem solar cells with sputtered NiO x is limited by the defective interface and suboptimal energy band alignment. This work focuses on reconstructing the sputtered NiO x surface with in situ biased plasma treatment (BPT). It is demonstrated that in situ BPT following sputtering induces both physical and chemical changes on the NiO x surface, enabling a smoother and denser surface with controllable Ni 3+ /Ni 2+ ratios. The in situ BPT NiO x is proven to be effective in improving the conductivity of NiO x , suppressing the non‐radiation recombination, fine‐tuning the energy band alignment, and facilitating the crystallinity of the perovskite. As a result, the power conversion efficiency (PCE) of wide bandgap perovskite solar cells is improved to 21.8% by the implementation of BPT NiO x . Further integrating the BPT NiO x into monolithic perovskite/silicon tandem solar cells results in a high PCE of 32.1% (certified 31.7%) with excellent operational stability.
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