电子背散射衍射
微观结构
材料科学
方向(向量空间)
衍射
欧拉角
复合材料
几何学
光学
数学
物理
出处
期刊:Journal of Chinese Electron Microscopy Society
日期:2011-01-01
摘要
The electron backscatter diffraction(EBSD) technology offers crystallographic data to analyze deformed microstructure qualitatively or quantitatively.Several EBSD data processing methods were used to study the low strain level microstructure in this paper,and the local orientation gradient and the deviation from an average orientation were applied to describe the deformed microstructure quantitatively.Matlab was used to reconstruct relative all-Euler map based on the raw EBSD data.The relative all-Euler map was a good method to study the deformed microstructure inside a single grain.
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