离子
原子物理学
电子电离
电离
物理
航程(航空)
电子
核物理学
材料科学
量子力学
复合材料
作者
I. Yamada,Atsunori Danjo,Takao Hirayama,Atsushi Matsumoto,Shunsuke Ohtani,H. Suzuki,H. Tawara,Toshinobu Takayanagi,K. Wakiya,Masuhiro Yoshino
摘要
Absolute cross sections for electron impact single ionization of O + , S + and S 2+ ions have been measured at an electron impact energy range from below threshold to 1000 eV, using the crossed beam technique. The measured cross sections for O + ions are reproduced quite well with the semiempirical Lotz formula over the whole energy range investigated. The measured cross sections for S + and S 2+ ions show a more rapid rise from the threshold to their peak than those expected from the Lotz formula. For S 2+ ions, another small bump beginning at 120 eV is observed, where no level exists that may contribute to any direct or indirect ionization processes.
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