成套系统
包对包
四平无引线包
集成电路封装
表面贴装技术
芯片级封装
互连
新产品开发
电子包装
小尺寸
计算机科学
上市时间
形状系数(电子)
机械工程
工程类
电子工程
集成电路
电气工程
材料科学
炸薯条
电信
印刷电路板
操作系统
晶片切割
胶粘剂
图层(电子)
营销
薄脆饼
业务
复合材料
作者
Feng Kao,Yu-Po Wang,Davidlion Wang,Jensen Tsai,Mike Tsai,Ryan Chiu,Eric He
标识
DOI:10.1115/ipack2019-6354
摘要
Abstract With consumer functionality increasing, more and more active die and passive component integrated into one packaging. Next 5G product design trend is requiring small form factor and better thermal dissipation, original single side product is no larger on optimized solution with larger package size, expensive coreless substrate structure stacked via, in order to accommodate product electrical and characteristic requirement. Considering market driving force toward high performance and lower package cost, double side system in package (SiP) structure is able to realize and fulfill form factor and product characteristic requirement. On this paper, double side SiP package platform will use dual side Surface Mount Technology (SMT) technology and double side molding structure to form outline and also shrink the overall package size. The calculation of package thermal performance can be enhance around 30% and package size can be shrunk around 40% area, compared to single side SiP which package area could be reduced from 64 mm2 to 36 mm2. With form factor change, product simulation is becoming important in order to mitigate assembly risk. The package characterization are including warpage and thermal simulation. Table1: Basic information comparison for traditional SiP & double side SiP PKG By utilizing advanced package technology and material, such as high speed SMT placement, molding technology, specific copper substrate design and interconnect material integrating into system in package module which provided a unique opportunity to address cost, performance, and time-to-market advantages. The SiP is also a good package platform to consolidate heterogeneous chips. It could be future package trend to accommodate market demand. The SiP structure has proceed the typical reliability testing results as a verification method. Finally, this paper shows the suitable double side SiP structure which can be adopt in smart phone, IoT and wearable devices product application.
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