Measuring the infrared emissivity of an object with the dual temperature method

Emissivity is one of the important parameters to reflect the thermal characteristics of the surface of an object. It plays a great role in the research of infrared coatings with high or low emissivity. In this paper, a novel non-contact experimental method is proposed to measure the coating's emissivity using the dual-temperature method, and the error of the measured infrared emissivity with different base board materials is analyzed.