微尺度化学
电阻率和电导率
导电体
材料科学
纳米
比例(比率)
微观结构
可靠性(半导体)
工程物理
纳米技术
金属
冶金
复合材料
电气工程
工程类
物理
热力学
功率(物理)
数学教育
数学
量子力学
出处
期刊:Chinese Journal of Materials Research
[Acta Metallurgica Sinica]
日期:2014-01-01
被引量:3
摘要
With the development of micro/nano-technologies, microstructural scales or geometrical dimensions of metal conductors in the micro/nano-devices are becoming shrunk from macroscopic scale to micron scale, submicron scale and even nanometer scale, leading to the fact that the electrical resistivity of metal conductors at room temperature tends to exhibit evident size effects. Recent studies on the electrical resistivity of metal conductors at different length scales were reviewed in this paper, focusing on the effects of the geometrical scales of microscalematerials and of the scale of microstructures and defects in the materials as well as the relevant theoretical models. Finally the developing tendency of the investigations on the electrical resistivity of metal conductors and the service reliability of the microscale metals in the future are also addressed.
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