材料科学
晶体管
铁电性
冯·诺依曼建筑
纳米技术
数码产品
可靠性(半导体)
场效应晶体管
计算机数据存储
比例(比率)
半导体
领域(数学分析)
工程物理
功率半导体器件
电气工程
铁电聚合物
集成电路
路径(计算)
光电子学
双极结晶体管
电子工程
半导体器件
柔性电子器件
分子电子学
计算机科学
非易失性存储器
系统集成
纳米电子学
作者
Haixin Qiu,Xiaoshi Qian,Dahong Qian,Paolo Samorì
标识
DOI:10.1002/adma.202517269
摘要
Abstract The rise of big data in today's computing has highlighted the significant limitations of von Neumann architectures for data storage and processing. Concurrently, the downscaling of silicon‐based transistors while retaining low power efficiency and high system reliability has become increasingly challenging. By adopting a post‐Moore approach, this Review proposes the use of hybrid systems comprising ferroelectric materials, 2D semiconductors, and functional molecular switches to respond to current demands for simultaneous high integration density and multifunctional performance. The representative applications of 2D ferroelectric field‐effect transistors (FeFETs) are reviewed and advances in shrinking ferroelectric domain walls at the (sub)nanometer scale are highlighted. The incorporation of molecular switches to enable multimodal device programmability is explored and the implementation of monolithic 3D (M3D) integration to boost chip‐level density and system functionality is discussed. Finally, a forward‐looking vision is presented for future transistors built upon novel ferroelectric platforms. Taken together, this triple‐hybrid paradigm offers a compelling path to transcend Moore's law, paving the way for next‐generation electronics with unprecedented functions and performance.
科研通智能强力驱动
Strongly Powered by AbleSci AI