X射线光电子能谱
谱线
结合能
单层
石墨烯
蒙特卡罗方法
材料科学
贝叶斯概率
复制品
计算机科学
物理
纳米技术
原子物理学
人工智能
核磁共振
数学
统计
艺术
视觉艺术
天文
作者
Hiroyuki Kumazoe,Kazunori Iwamitsu,Masaki Imamura,Kazutoshi Takahashi,Yoh-ichi Mototake,Masato Okada,Ichiro Akai
标识
DOI:10.1038/s41598-023-40208-3
摘要
Abstract We analyzed the X-ray photoelectron spectra (XPS) of carbon 1s states in graphene and oxygen-intercalated graphene grown on SiC(0001) using Bayesian spectroscopy. To realize highly accurate spectral decomposition of the XPS spectra, we proposed a framework for discovering physical constraints from the absence of prior quantified physical knowledge, in which we designed the prior probabilities based on the found constraints and the physically required conditions. This suppresses the exchange of peak components during replica exchange Monte Carlo iterations and makes possible to decompose XPS in the case where a reliable structure model or a presumable number of components is not known. As a result, we have successfully decomposed XPS of one monolayer (1ML), two monolayers (2ML), and quasi-freestanding 2ML (qfs-2ML) graphene samples deposited on SiC substrates with the meV order precision of the binding energy, in which the posterior probability distributions of the binding energies were obtained distinguishably between the different components of buffer layer even though they are observed as hump and shoulder structures because of their overlapping.
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