X射线光电子能谱
阿尔法(金融)
金属
材料科学
分析化学(期刊)
化学
冶金
化学工程
环境化学
工程类
统计
数学
结构效度
心理测量学
作者
Braxton J. Kulbacki,Samira Jafari,A. Dean,S.H. Ko,Matthew R. Linford,George H. Major
摘要
Silver metal was analyzed by x-ray photoelectron spectroscopy using a Thermo Scientific K-Alpha instrument with an Al Kα x-ray source (1486.6 eV). The silver survey spectrum and high-resolution Ag 3d, Ag M4N45N45, Ag M5N45N45, Ag 3p, O 1s, C 1s, Ar 2p, Ag 4p, and Ag 4s narrow scans were obtained. The sample analyzed is the standard instrument calibration silver foil mounted inside the analysis chamber of the K-Alpha. Sputtering with monoatomic Ar+ was performed prior to analysis to remove surface contamination. Narrow and survey scans were collected at 50 and 200 eV pass energy, respectively.
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