电源完整性
中间层
信号完整性
信号(编程语言)
功率(物理)
材料科学
硅
通过硅通孔
光电子学
电子工程
电气工程
计算机科学
工程类
纳米技术
印刷电路板
物理
图层(电子)
蚀刻(微加工)
量子力学
程序设计语言
作者
Kuei-Ju Lin,Chien-Min Lin,Ruey‐Beei Wu
标识
DOI:10.1109/tsipi.2024.3487547
摘要
As high-speed digital systems require faster transmission and computing speed, the impact of complex interconnects in a limited space on the electrical performance of the channel-link system becomes more and more serious. This article aims to optimize the interconnection links between the enhanced second-generation high-bandwidth memory modules and systems on chip (CPU or GPU) for achieving the optimized signal and power integrity. Since the signal lines are susceptible to crosstalk, an improved diagonal-staggering wiring scheme is proposed to reduce the coupling coefficient between the signal lines by at least five times. The contour map for the mismatched systems with the peak distortion analysis is then applied to quickly find the optimal impedance design of lines for the best eye diagram. At a data rate of 6.4 Gb/s with a rise time of 15 ps, the eye height is optimized to be 4.6 times that in the original layout. Finally, the power supply and grounds are interleaved to increase the capacitance and alleviate the power noise through the power delivery network (PDN) in the construction of the four-element voltage regulator module along with the on-chip capacitor and the specific power–ground layers. Modifying the layout scheme in the PDN with reasonable decoupling capacitance can lead to an additional 1.4 times improvement in the eye height over the original design.
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