蚀刻(微加工)
材料科学
氮化镓
等离子体刻蚀
干法蚀刻
等离子体
光电子学
图层(电子)
反应离子刻蚀
纳米技术
限制
镓
半导体
氮化物
宽禁带半导体
冶金
物理
工程类
机械工程
量子力学
作者
Lulu Guan,Xingyu Li,Dongchen Che,Kaidong Xu,Shiwei Zhuang
标识
DOI:10.1088/1674-4926/43/11/113101
摘要
Abstract With the development of the third generation of semiconductor devices, it is essential to achieve precise etching of gallium nitride (GaN) materials that is close to the atomic level. Compared with the traditional wet etching and continuous plasma etching, plasma atomic layer etching (ALE) of GaN has the advantages of self-limiting etching, high selectivity to other materials, and smooth etched surface. In this paper the basic properties and applications of GaN are presented. It also presents the various etching methods of GaN. GaN plasma ALE systems are reviewed, and their similarities and differences are compared. In addition, the industrial application of GaN plasma ALE is outlined.
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