Usman Younis,Xianshu Luo,Bowei Dong,Li Huang,Andy Eu-Jin Lim,Patrick Lo,Andrew A. Bettiol,Kah‐Wee Ang
标识
DOI:10.1109/cleopr.2017.8118714
摘要
We present mid-IR waveguides developed in Ge-on-SOI and SOI. The minimum loss achieved for Ge-on-SOI strip waveguides is ~8 dB/cm and for SOI waveguides is ~1.4 dB/cm for TE polarized light at 3.7 μm. These waveguides demonstrate the feasibility of employing Ge-on-SOI for high power integrated sensing and SOI to achieve low-loss interconnects.